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dc.contributor.authorQizheng Ji-
dc.contributor.authorTaochen Gu-
dc.contributor.authorZhiliang Gao-
dc.contributor.authorMing Yang-
dc.contributor.authorYafei Yuan-
dc.contributor.authorHongyu Du-
dc.contributor.authorFayu Wan-
dc.contributor.authorMurad, Nour Mohammad-
dc.contributor.authorFontgalland, Glauco-
dc.contributor.authorSilva, Hugerles Sales-
dc.contributor.authorRavelo, Blaise-
dc.date.accessioned2024-04-09T13:35:51Z-
dc.date.available2024-04-09T13:35:51Z-
dc.date.issued2023-02-27-
dc.identifier.citationQIZHENG JI et al. CSRR DGS-Based bandpass negative group delay circuit design. IEEE Access, [S.l.], v. 11, 27 fev. 2023. DOI: 10.1109/ACCESS.2023.3249968. Disponível em: https://ieeexplore.ieee.org/document/10054376. Acesso em: 26 março 2024.pt_BR
dc.identifier.urihttp://repositorio2.unb.br/jspui/handle/10482/48056-
dc.language.isoengpt_BR
dc.publisherIEEEpt_BR
dc.rightsAcesso Abertopt_BR
dc.titleCSRR DGS-Based bandpass negative group delay circuit designpt_BR
dc.typeArtigopt_BR
dc.subject.keywordCircuitos eletrônicospt_BR
dc.subject.keywordComunicação sem fiopt_BR
dc.subject.keywordMicroondaspt_BR
dc.rights.licenseThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License. For more information, see https://creativecommons.org/licenses/by-nc-nd/4.0/pt_BR
dc.identifier.doi10.1109/ACCESS.2023.3249968pt_BR
dc.description.abstract1The unfamiliar negative group delay (NGD) circuit is the less familiar function for most of RF and microwave design engineers. Among the existing types, the bandpass (BP) NGD type circuits are the most convenient for the wireless communication microwave technology. Therefore, it is particularly important to explore different microwave circuit topologies operating as BP-NGD function. An innovative design of BP-NGD topology constituted by defected ground structure (DGS) with complementary split ring resonator (CSRR) is developed in the present paper. The DGS-based BP-NGD structure design method is introduced in function of the CSRR geometrical elements followed by S-parameter parametric analyses. As proof-of concept (POC), the design method of the proposed BP-NGD passive fully distributed circuit is described. The effectiveness of the BP-NGD structure and the test feasibility are investigated by implementing two different prototypes represented by single- and double-wing DGS passive circuits. It is observed that significant BP-NGD function performances were validated by well-correlated simulations and measurements showing -1.9 ns NGD value around the center frequency, 2.46 GHz over 31 MHz NGD bandwidth. In addition, the tested BP-NGD prototypes present insertion loss better than 4 dB and reflection loss better than 16.7 dB. Because of its potential integration, the investigated BP-NGD circuit is potentially useful for the communication system performance improvement for example via delay effect reduction in the RF and microwave devices.pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-8066-1260pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7613-226Xpt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-1370-3816pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-5059-0649pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-5626-6065pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0002-0497-7260pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-3506-3522pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0003-0165-5853pt_BR
dc.identifier.orcidhttps://orcid.org/0000-0001-7334-5016pt_BR
dc.contributor.affiliationArmy Engineering University, National Key Laboratory on Electromagnetic Environment Effectspt_BR
dc.contributor.affiliationBeijing Institute of Spacecraft Environment Engineeringpt_BR
dc.contributor.affiliationNanjing University of Information Science and Technology (NUIST), School of Electronic and Information Engineeringpt_BR
dc.contributor.affiliationBeijing Orient Institute for Measurement and Testpt_BR
dc.contributor.affiliationBeijing Orient Institute for Measurement and Testpt_BR
dc.contributor.affiliationBeijing Orient Institute for Measurement and Testpt_BR
dc.contributor.affiliationNanjing University of Information Science and Technology (NUIST), School of Electronic and Information Engineeringpt_BR
dc.contributor.affiliationNanjing University of Information Science and Technology (NUIST), School of Electronic and Information Engineeringpt_BR
dc.contributor.affiliationUniversity of La Réunion, Institute Universitaire de Technologie, Network and Telecom Laboratory, PIMENTpt_BR
dc.contributor.affiliationFederal University of Campina Grande, Applied Electromagnetic and Microwave Laboratorypt_BR
dc.contributor.affiliationUniversidade de Aveiro, Campus Universitário de Santiago, Instituto de Telecomunicações, Departamento de Eletrónica, Telecomunicações e Informáticapt_BR
dc.contributor.affiliationUniversity of Brasília, Department of Electric Engineeringpt_BR
dc.contributor.affiliationNanjing University of Information Science and Technology (NUIST), School of Electronic and Information Engineeringpt_BR
dc.description.unidadeFaculdade de Tecnologia (FT)pt_BR
dc.description.unidadeDepartamento de Engenharia Elétrica (FT ENE)pt_BR
dc.description.ppgPrograma de Pós-Graduação em Engenharia Elétricapt_BR
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